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X-ray photoelectron spectroscopy
Results: 274

#	Item
91	Photon Factory Activity Report 2010 #28 Part BSurface and Interface 1C/2006S2-002 Topmost-Surface-Sensitive Si-2p Photoelectron Spectra of Clean Si×1 Measured with Photoelectron Auger Coincidence Spectros Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2012-01-30 04:32:45 Spectroscopy Atomic physics Surface chemistry Molecular physics X-ray photoelectron spectroscopy Photoemission spectroscopy Auger electron spectroscopy Auger effect Electron spectroscopy Scientific method Science Physics
92	Photon Factory Activity Report 2006 #24 Part BElectronic Structure of Condensed Matter 1C, 2C/2005S2-002 Temperature-dependent spectral weight transfer in La0.8Sr0.2MnO3 thin films Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2010-01-05 10:33:42 Emission spectroscopy Spectroscopy Condensed matter physics Photoemission spectroscopy Molecular physics Surface chemistry Electron Angle-resolved photoemission spectroscopy X-ray photoelectron spectroscopy Physics Chemistry Science
93	Surface and Interface 7A/2001S2-003 NEXAFS study of CO-Cs coadsorption on Pt(111) Toru SHIMADA, Hiroshi KONDOH, Ikuyo NAKAI, Masanari NAGASAKA Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2010-01-05 10:30:26 Materials science Spectroscopy Condensed matter physics Environmental chemistry Surface chemistry XANES X-ray photoelectron spectroscopy X-ray absorption fine structure Photoemission spectroscopy Chemistry Science Scientific method
94	Photon Factory Activity Report 2006 #24 Part BElectronic Structure of Condensed Matter 2C, 7C/2004G013, 2004G204 Particle-size dependence of resonant X-ray emission spectroscopy in BaTiO3 Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2010-01-05 10:33:41 Spectroscopy Molecular physics Atomic physics X-rays Surface chemistry Resonant inelastic X-ray scattering X-ray photoelectron spectroscopy Electron configuration X-ray Chemistry Physics Science
95	Photon Factory Activity Report 2007 #25 Part BSurface and Interface 27A/2007G107 Adsorption behavior of L-cysteine molecule with ITO substrates using angledependent NEXAFS and XPS techniques Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2010-01-05 10:34:54 Materials science Spectroscopy Condensed matter physics Environmental chemistry Surface chemistry XANES X-ray absorption fine structure X-ray photoelectron spectroscopy Photoemission spectroscopy Chemistry Science Scientific method
96	Photon Factory Activity Report 2010 #28 Part BSurface and Interface 13A/2009S2-007 Mixed valence state of TNAP on Bi(001) Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2012-01-30 04:32:45 Spectroscopy Surface chemistry Molecular physics Emerging technologies X-ray photoelectron spectroscopy Graphene Photoemission spectroscopy Chemistry Physics Science
97	Photon Factory Activity Report 2004 #22 Part BSurface and Interface 11D/2004G291 XPS study of the initial oxidation stage on HF-treated Si(100) surfaces Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2010-01-05 10:31:21 Spectroscopy Surface chemistry Molecular physics Atomic physics X-ray photoelectron spectroscopy Photoelectric effect Oxide Ultra-high vacuum Chemistry Physics Physical chemistry
98	Photon Factory Activity Report 2010 #28 Part BSurface and Interface 13A/2009S007 Ultra-fast electron transfer from adsorbed molecule to TiO2 substrate Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2012-01-30 04:32:46 Spectroscopy Condensed matter physics Environmental chemistry Materials science XANES X-ray photoelectron spectroscopy Photoemission spectroscopy Extended X-ray absorption fine structure Electron Scientific method Science Physics
99	Photon Factory Activity Report 2008 #26 Part BSurface and Interface 13C, 27A/2008G575 Non-destructive depth profiling for the surface of β-FeSi2 thin films Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2010-01-05 10:36:07 Spectroscopy Materials science Excipients Silicon dioxide X-ray photoelectron spectroscopy Chemistry Scientific method Science
100	Photon Factory Activity Report 2006 #24 Part BSurface and Interface 2C/2005S2-002 Chemical-state-resolved in-depth profile in a SiO2/SiN stack film studied by angleresolved photoemission spectroscopy using synch Add to Reading List Source URL: pfwww.kek.jp Language: English - Date: 2010-01-05 10:33:37 Spectroscopy Molecular physics Surface chemistry X-ray photoelectron spectroscopy Photoemission spectroscopy Silicon dioxide Electron Chemical state Physics Chemistry Science

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